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              Rietveld Method

              Rietveld Method
              The full-spectrum fitting structural refinement proposed by H. M. Rietveld in 1969 is a valuable analytical method in the study of crystal material structure. Various structural information of the sample can be obtained including: phase content, phase structure, unit cell parameter, crystal size and the like. Compared with traditional quantitative methods, Rietveld method can obtain accurate results with a content of less than 1% without standard samples. Prior to this, it was impossible to perform accurate quantitative analysis of mixed samples using powder diffraction.



              DX-2700BH X-ray Diffractometer

              DX-2800 High Resolution X-ray Diffractometer